| 1 |
The influence of curing methods on the physico-chemical properties of printed mesoporous titania patterns reinforced by methylsilica binder
Dzik P, Vesely M, Pachovska M, Neumann-Spallart M, Bursikova V, Homola T
Catalysis Today, 313, 26, 2018 |
| 2 |
Low pressure plasmachemical processing of multi-walled carbon nanotubes for the production of polyurethane composite films with improved mechanical properties
Zajickova L, Elias M, Bursikova V, Studynkova Z, Mazankova V, Michlicek M, Houdkova J
Thin Solid Films, 538, 7, 2013 |
| 3 |
Synthesis and Characterization of Nanostructured a-C:H (Hydrogenated Amorphous Carbon) Thin Films by Gaseous Thermionic Vacuum Arc (G-TVA) Deposition Technique
Vladoiu R, Ciupina V, Contulov M, Dinca V, Mandes A, Bursikova V
Plasma Chemistry and Plasma Processing, 32(2), 219, 2012 |
| 4 |
Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films
Franta D, Necas D, Zajickova L, Bursikova V, Cobet C
Thin Solid Films, 519(9), 2694, 2011 |
| 5 |
Ellipsometric characterisation of thin films non-uniform in thickness
Necas D, Franta D, Bursikova V, Ohlidal I
Thin Solid Films, 519(9), 2715, 2011 |
| 6 |
Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry
Ohlidal I, Ohlidal M, Necas D, Franta D, Bursikova V
Thin Solid Films, 519(9), 2874, 2011 |
| 7 |
Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture
Zajickova L, Franta D, Necas D, Bursikova V, Muresan M, Perina V, Cobet C
Thin Solid Films, 519(13), 4299, 2011 |
| 8 |
Relationship between effective ionic radii, structure and electro-mechanical properties of zirconia stabilized with rare earth oxides M2O3 (M = Yb, Y, Sm)
Hartmanova M, Lomonova E, Kubel F, Schneider J, Bursikova V, Jergel M, Navratil V, Kundracik F
Journal of Materials Science, 44(1), 234, 2009 |
| 9 |
Optical properties of diamond-like carbon films containing SiOx studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry
Franta D, Ohlidal I, Bursikova V, Zajickova L
Thin Solid Films, 455-56, 393, 2004 |
