검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Improved sub-threshold slope in short-channel vertical MOSFETs using FILOX oxidation Hakim MMA, Tan L, Buiu O, Redman-White W, Hall S, Ashburn P Solid-State Electronics, 53(7), 753, 2009 |
| 2 |
Interface defects in HfO2, LaSiOx, and Gd2O3 high-k/metal-gate structures on silicon Hurley PK, Cherkaoui K, O'Connor E, Lemme MC, Gottlob HDB, Schmidt M, Hall S, Lu Y, Buiu O, Raeissi B, Piscator J, Engstrom O, Newcomb SB Journal of the Electrochemical Society, 155(2), G13, 2008 |
| 3 |
The influence of junction depth on short channel effects in vertical sidewall MOSFETs Tan L, Buiu O, Hall S, Gill E, Uchino T, Ashburn P Solid-State Electronics, 52(7), 1002, 2008 |
| 4 |
High-k-oxide/silicon interfaces characterized by capacitance frequency spectroscopy Raeissi B, Piscator J, Engstrom O, Hall S, Buiu O, Lemme MC, Gottlob HDB, Hurley PK, Cherkaoui K, Osten HJ Solid-State Electronics, 52(9), 1274, 2008 |
| 5 |
Ellipsometric analysis of mixed metal oxides thin films Buiu O, Davey W, Lu Y, Mitrovic IZ, Hall S Thin Solid Films, 517(1), 453, 2008 |
| 6 |
Chemical and optical profiling of ultra thin high-k dielectrics on silicon Bernardini S, MacKenzie M, Buiu O, Bailey P, Noakes TCQ, Davey WM, Hamilton B, Hall S Thin Solid Films, 517(1), 459, 2008 |
| 7 |
Navigation aids in the search for future high-k dielectrics: Physical and electrical trends Engstrom O, Raeissi B, Hall S, Buiu O, Lemme MC, Gottlob HDB, Hurley PK, Cherkaoui K Solid-State Electronics, 51(4), 622, 2007 |
| 8 |
Investigation of optical and electronic properties of hafnium aluminate films deposited by Metal-Organic Chemical Vapour Deposition Buiu O, Lu Y, Hall S, Mitrovic IZ, Potter RJ, Chalker PR Thin Solid Films, 515(7-8), 3772, 2007 |
| 9 |
Spectroellipsometric assessment of HfO2 thin films Buiu O, Lu Y, Mitrovic IZ, Hall S, Chalker P, Potter RJ Thin Solid Films, 515(2), 623, 2006 |
| 10 |
GSMBE growth and structural characterisation of SiGeC layers for HBT Zhang J, Neave JH, Li XB, Fewster PF, El Mubarek HAW, Ashburn P, Mitrovic IZ, Buiu O, Hall S Journal of Crystal Growth, 278(1-4), 505, 2005 |