검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Analysis of crystal defects on GaN-based semiconductors with advanced scanning probe microscope techniques Hofer A, Benstetter G, Biberger R, Leirer C, Bruderl G Thin Solid Films, 544, 139, 2013 |
| 2 |
Quality and thermal stability of thin InGaN films Queren D, Schillgalies M, Avramescu A, Bruderl G, Laubsch A, Lutgen S, Strauss U Journal of Crystal Growth, 311(10), 2933, 2009 |
| 3 |
Influence of an in situ-deposited SiNx intermediate layer inside GaN and AlGaN layers on SiC substrates Engl K, Beer M, Gmeinwieser N, Schwarz UT, Zweck J, Wegscheider W, Miller S, Miler A, Lugauer HJ, Bruderl G, Lell A, Harle V Journal of Crystal Growth, 289(1), 6, 2006 |