검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Improved Sensitivity and Depth Resolution for Analyses of Shallow P-N-Junctions in Silicon with Secondary-Ion Mass-Spectrometry Erickson JW, Brigham R Journal of Vacuum Science & Technology B, 14(1), 353, 1996 |
| No. | Article |
|---|---|
| 1 |
Improved Sensitivity and Depth Resolution for Analyses of Shallow P-N-Junctions in Silicon with Secondary-Ion Mass-Spectrometry Erickson JW, Brigham R Journal of Vacuum Science & Technology B, 14(1), 353, 1996 |