화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Synthesis of strained SiGe on Si(100) by pulsed laser induced epitaxy
Kociniewski T, Fossard F, Boulmer J, Bouchier D
Thin Solid Films, 518(9), 2542, 2010
2 Highly doped Si and Ge formed by GILD (gas immersion laser doping); from GILD to superconducting silicon
Cammilleri D, Fossard F, Debarre D, Manh CT, Dubois C, Bustarret E, Marcenat C, Achatz P, Bouchier D, Boulmer J
Thin Solid Films, 517(1), 75, 2008
3 Localized laser thermal annealing of nanometric SiGe layers protected by a dielectric Bragg mirror
Cammilleri D, Fossard F, Halbwax M, Manh CT, Yam N, Debarre D, Boulmer J, Bouchier D
Thin Solid Films, 517(1), 327, 2008
4 Laser doping for microelectronics and microtechnology
Sarnet T, Kerrien G, Yaakoubi N, Bosseboeuf A, Dufour-Gergam E, Debarre D, Boulmer J, Kakushima K, Laviron C, Hernandez M, Venturini J, Bourouina T
Applied Surface Science, 247(1-4), 537, 2005
5 Gas immersion laser doping (GILD) for ultra-shallow junction formation
Kerrien G, Sarnet T, Debarre D, Boulmer J, Hernandez M, Laviron C, Semeria MN
Thin Solid Films, 453-54, 106, 2004
6 Excimer laser thermal processing of ultra-shallow junction: laser pulse duration
Venturini J, Hernandez M, Kerrien G, Laviron C, Camel D, Santailler JL, Sarnet I, Boulmer J
Thin Solid Films, 453-54, 145, 2004
7 Optical characterization of laser processed ultra-shallow junctions
Kerrien G, Hernandez M, Laviron C, Sarnet T, Debarre D, Noguchi T, Zahorski D, Venturini J, Semeria MN, Boulmer J
Applied Surface Science, 208, 277, 2003
8 Laser thermal processing for ultra shallow junction formation: numerical simulation and comparison with experiments
Hernandez M, Venturini J, Zahorski D, Boulmer J, Debarre D, Kerrien G, Sarnet T, Laviron C, Semeria MN, Camel D, Santailler JL
Applied Surface Science, 208, 345, 2003
9 Ultra-shallow, super-doped and box-like junctions realized by laser-induced doping
Kerrien G, Boulmer J, Debarre D, Bouchier D, Grouillet A, Lenoble D
Applied Surface Science, 186(1-4), 45, 2002
10 Local Strains in Si1-X-Ygexcy Alloys as Deduced from Vibrational Frequencies
Finkman E, Rucker H, Meyer F, Prawer SD, Bouchier D, Boulmer J, Bodnar S, Regolini JL
Thin Solid Films, 294(1-2), 118, 1997