화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Results of four European round-robins on short-circuit current temperature coefficient measurements of photovoltaic devices of different size
Salis E, Pavanello D, Kroger I, Winter S, Bothe K, Hinken D, Gandy T, Hohl-Ebinger J, Friesen G, Dittmann S, Dubard J, Mullejans H
Solar Energy, 179, 424, 2019
2 Interlaboratory comparison of short-circuit current versus irradiance linearity measurements of photovoltaic devices
Bliss M, Betts T, Gottschalg R, Salis E, Mullejans H, Winter S, Kroeger I, Bothe K, Hinken D, Hohl-Ebinger J
Solar Energy, 182, 256, 2019
3 Towards an improved Laplacian-based photoluminescence image evaluation method
Breitenstein O, Bauer J, Hinken D, Bothe K
Solar Energy Materials and Solar Cells, 142, 92, 2015
4 Minority carrier lifetime in silicon photovoltaics: The effect of oxygen precipitation
Murphy JD, McGuire RE, Bothe K, Voronkov VV, Falster RJ
Solar Energy Materials and Solar Cells, 120, 402, 2014
5 Lifetimes exceeding 1 ms in 1-Omega cm boron-doped Cz-silicon
Walter DC, Lim B, Bothe K, Falster R, Voronkov VV, Schmidt J
Solar Energy Materials and Solar Cells, 131, 51, 2014
6 Limitations in the accuracy of photoconductance-based lifetime measurements
Schuler N, Anger S, Dornich K, Niklas JR, Bothe K
Solar Energy Materials and Solar Cells, 98, 245, 2012
7 Comments on the paper "Detection and analysis of hot-spot formation in solar cells" published by M. Simon and EL Meyer in Solar Energy Materials & Solar Cells 94 (2010) 106-113
Bauer J, Kwapil W, Lausch D, Schubert MC, Warta W, Bothe K, Breitenstein O
Solar Energy Materials and Solar Cells, 99, 362, 2012
8 Dynamic photoluminescence lifetime imaging of multicrystalline silicon bricks
Herlufsen S, Bothe K, Schmidt J, Brendel R, Siegmund S
Solar Energy Materials and Solar Cells, 106, 42, 2012
9 Reverse saturation current density imaging of highly doped regions in silicon: A photoluminescence approach
Muller J, Bothe K, Herlufsen S, Hannebauer H, Ferre R, Brendel R
Solar Energy Materials and Solar Cells, 106, 76, 2012
10 Zinc oxide thin film transistors with Schottky source barriers
Ma AM, Gupta M, Chowdhury FR, Shen M, Bothe K, Shankar K, Tsui Y, Barlage DW
Solid-State Electronics, 76, 104, 2012