검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Electrical properties of cobalt and copper contamination in processed silicon Benton JL, Boone T, Jacobson DC, Silverman PJ, Rosamilia JM, Rafferty CS, Weinzierl S, Vu B Journal of the Electrochemical Society, 148(6), G326, 2001 |
| 2 |
Behavior of molybdenum in silicon evaluated for integrated circuit processing Benton JL, Jacobson DC, Jackson B, Johnson JA, Boone T, Eaglesham DJ, Stevie FA, Becerro J Journal of the Electrochemical Society, 146(5), 1929, 1999 |
| 3 |
Gate technology for 70 nm metal-oxide-semiconductor field-effect transistors with ultrathin (< 2 nm) oxides Tennant D, Klemens F, Sorsch T, Baumann F, Timp G, Layadi N, Kornblit A, Sapjeta BJ, Rosamilia J, Boone T, Weir B, Silverman P Journal of Vacuum Science & Technology B, 15(6), 2799, 1997 |
| 4 |
On Raising Energy-Expenditure in OB/OB Mice - Response Pelleymounter MA, Cullen MJ, Baker MB, Hecht R, Winters D, Boone T, Collins F Science, 276(5315), 1132, 1997 |
| 5 |
Effects of the Obese Gene-Product on Body-Weight Regulation in OB/OB Mice Pelleymounter MA, Cullen MJ, Baker MB, Hecht R, Winters D, Boone T, Collins F Science, 269(5223), 540, 1995 |
| 6 |
Comparison of Advanced Plasma Sources for Etching Applications .4. Plasma-Induced Damage in a Helicon and a Multipole Electron-Cyclotron-Resonance Source Blayo N, Tepermeister I, Benton JL, Higashi GS, Boone T, Onuoha A, Klemens FP, Ibbotson DE, Sawin HH Journal of Vacuum Science & Technology B, 12(3), 1340, 1994 |