검색결과 : 1건
No. | Article |
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1 |
Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells and MOSFETs Bonfiglio V, Iannaccone G Solid-State Electronics, 84, 127, 2013 |
No. | Article |
---|---|
1 |
Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells and MOSFETs Bonfiglio V, Iannaccone G Solid-State Electronics, 84, 127, 2013 |