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| No. | Article |
|---|---|
| 1 |
Characterization of TiO2/SiO2 Multilayers by High-Resolution Transmission Electron-Microscopy and Electron-Energy-Loss Spectroscopy Yuzhang K, Boisjolly G, Rivory J, Kilian L, Colliex C Thin Solid Films, 253(1-2), 299, 1994 |