검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Performance and reliability of HfAlOx-based interpoly dielectrics for floating-gate Flash memory Govoreanu B, Wellekens D, Haspeslagh L, Brunco DP, De Vos J, Aguado DR, Blomme P, van der Zanden K, Van Houdt J Solid-State Electronics, 52(4), 557, 2008 |
| 2 |
An effective model for analysing tunneling gate leakage currents through ultrathin oxides and high-k gate stacks from Si inversion layers Govoreanu B, Blomme P, Henson K, Van Houdt J, De Meyer K Solid-State Electronics, 48(4), 617, 2004 |
| 3 |
A model for tunneling current in multi-layer tunnel dielectrics Govoreanu B, Blomme P, Rosmeulen M, Van Houdt J, De Meyer K Solid-State Electronics, 47(6), 1045, 2003 |