화학공학소재연구정보센터
검색결과 : 9건
No. Article
1 Full elemental depth-profiling with nanoscale resolution: The potential of Elastic Recoil Detection (ERD) in membrane science
Verbeke R, Bergmaier A, Eschbaumer S, Marien H, Dollinger G, Vankelecom IFJ
Journal of Membrane Science, 572, 102, 2019
2 Correlation of chemical composition and electrical properties of rf sputtered alumina films
Voigt M, Bergmaier A, Dollinger G, Sokolowski M
Journal of Vacuum Science & Technology A, 27(2), 234, 2009
3 Optimization of thin, nitrogen-rich silicon oxynitrides grown by rapid thermal nitridation
Ludsteck A, Schulze J, Eisele I, Dietl W, Chung H, Nenyei Z, Bergmaier A, Dollinger G
Journal of the Electrochemical Society, 152(5), G334, 2005
4 Errors in near-surface and interfacial profiling of boron and arsenic
Vandervorst W, Janssens T, Brijs B, Conard T, Huyghebaert C, Fruhauf J, Bergmaier A, Dollinger G, Buyuklimanli T, VandenBerg JA, Kimura K
Applied Surface Science, 231-2, 618, 2004
5 An (un)solvable problem in SIMS: B-interfacial profiling
Vandervorst W, Janssens T, Loo R, Caymax M, Peytier I, Lindsay R, Fruhauf J, Bergmaier A, Dollinger G
Applied Surface Science, 203, 371, 2003
6 Physical characterization of thin ALD-Al2O3 films
Jakschik S, Schroeder U, Hecht T, Krueger D, Dollinger G, Bergmaier A, Luhmann C, Bartha JW
Applied Surface Science, 211(1-4), 352, 2003
7 Epitaxial CaGe2 films on germanium
Vogg G, Brandt MS, Stutzmann M, Genchev I, Bergmaier A, Gorgens L, Dollinger G
Journal of Crystal Growth, 212(1-2), 148, 2000
8 The effect of nitrogen on low temperature growth of diamond films
Stiegler J, Bergmaier A, Michler J, Laufer S, Dollinger G, Blank E
Thin Solid Films, 352(1-2), 29, 1999
9 Thermal-Stability and Desorption of Group-III Nitrides Prepared by Metal-Organic Chemical-Vapor-Deposition
Ambacher O, Brandt MS, Dimitrov R, Metzger T, Stutzmann M, Fischer RA, Miehr A, Bergmaier A, Dollinger G
Journal of Vacuum Science & Technology B, 14(6), 3532, 1996