검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Evaluation of the ruggedness of power DMOS transistor from electro-thermal simulation of UIS behaviour Donoval D, Vrbicky A, Marek J, Chvala A, Beno P Solid-State Electronics, 52(6), 892, 2008 |
| No. | Article |
|---|---|
| 1 |
Evaluation of the ruggedness of power DMOS transistor from electro-thermal simulation of UIS behaviour Donoval D, Vrbicky A, Marek J, Chvala A, Beno P Solid-State Electronics, 52(6), 892, 2008 |