1 |
Functionalization of amorphous nitrogenated carbon thin film electrodes for improved detection of cadmium vs. copper cations Seck SM, Charvet S, Fall M, Baudrin E, Geneste F, Lejeune M, Benlahsen M Journal of Electroanalytical Chemistry, 738, 154, 2015 |
2 |
Influence of the radio-frequency power on the physical and optical properties of plasma polymerized cyclohexane thin films Manaa C, Lejeune M, Kouki F, Durand-Drouhin O, Bouchriha H, Zellama K, Benlahsen M Thin Solid Films, 560, 55, 2014 |
3 |
The effect of the terminating bonds on the electronic properties of sputtered carbon nitride thin films Alibart F, Peponas S, Charvet S, Benlahsen M Thin Solid Films, 519(10), 3430, 2011 |
4 |
Spectroscopic investigation of the physicochemical origin of the spontaneous delamination of the sputtered amorphous carbon nitride films Peponas S, Guedda M, Benlahsen M Applied Surface Science, 255(20), 8706, 2009 |
5 |
Comparison and semiconductor properties of nitrogen doped carbon thin films grown by different techniques Alibart F, Drouhin OD, Benlahsen M, Muhl S, Rodil SE, Camps E, Escobar-Alarcon L Applied Surface Science, 254(17), 5564, 2008 |
6 |
Microstructure and electronic investigations of carbon nitride films deposited by RF magnetron sputtering Lagrini A, Charvet S, Benlahsen M, Debiemme-Chouvy C, Deslouis C, Cachet H Thin Solid Films, 482(1-2), 41, 2005 |
7 |
Microstructural relaxation of hydrogenated amorphous carbon thin films Bouzerar R, Benlahsen M, Picot JC Thin Solid Films, 482(1-2), 90, 2005 |
8 |
Deposition mechanism of sputtered amorphous carbon nitride thin film Durand-Drouhin O, Benlahsen M, Clin M, Bouzerar R Applied Surface Science, 223(4), 269, 2004 |
9 |
Correlation between plasma parameters, microstructure and optical properties of sputtering magnetron CNx films Lejeune M, Durand-Drouhin O, Charvet S, Grosman A, Ortega C, Benlahsen M Thin Solid Films, 444(1-2), 1, 2003 |
10 |
Optical investigations and Raman scattering characterisation of carbon bonding in hard amorphous hydrogenated carbon films Lejeune M, Durand-Drouhin O, Henocque J, Bouzerar R, Zeinert A, Benlahsen M Thin Solid Films, 389(1-2), 233, 2001 |