화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Structural and electronic properties of in-situ phosphorous-doped Ge layers grown by reduced pressure-chemical vapour deposition
Hartmann JM, Benevent V, Reboud V, Chelnokov A, Guilloy K, Pauc N, Calvo V
Thin Solid Films, 602, 13, 2016
2 Epitaxial growth of Si and SiGe at temperatures lower than 500 degrees C with disilane and germane
Aubin J, Hartmann JM, Benevent V
Thin Solid Films, 602, 36, 2016
3 Potentialities of disilane for the low temperature epitaxy of intrinsic and boron-doped SiGe
Hartmann JM, Benevent V, Veillerot M, Halimaoui A
Thin Solid Films, 557, 19, 2014
4 Mushroom-free selective epitaxial growth of Si, SiGe and SiGe:B raised sources and drains
Hartmann JM, Benevent V, Barnes JP, Veillerot M, Lafond D, Damlencourt JF, Morvan S, Previtali B, Andrieu F, Loubet N, Dutartre D
Solid-State Electronics, 83, 10, 2013
5 A benchmarking of silane, disilane and dichlorosilane for the low temperature growth of group IV layers
Hartmann JM, Benevent V, Damlencourt JF, Billon T
Thin Solid Films, 520(8), 3185, 2012
6 Influence of induced stress on enrichment kinetic during local Ge condensation of SiGe/SOI mesas
Dechoux N, Damlencourt JF, Rivallin P, Brianceau P, Bernasconi S, Benevent V, Vallee C, Barbe JC, Billon T, Bensahel D
Thin Solid Films, 518, S92, 2010