검색결과 : 7건
No. | Article |
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1 |
Calculation of 2-Center Integrals Involving a Rapidly Oscillating Free-Electron Wave-Function Opdebeek SS, Driessen JP, Beijerinck HC, Verhaar BJ Journal of Chemical Physics, 106(1), 182, 1997 |
2 |
Ion-Assisted Si/Xef2-Etching - Influence of Ion/Neutral Flux Ratio and Ion Energy Vugts MJ, Hermans LJ, Beijerinck HC Journal of Vacuum Science & Technology A, 14(4), 2138, 1996 |
3 |
Si/Xef2 Etching - Temperature-Dependence Vugts MJ, Verschueren GL, Eurlings MF, Hermans LJ, Beijerinck HC Journal of Vacuum Science & Technology A, 14(5), 2766, 1996 |
4 |
Si/Xef2 Etching - Reaction Layer Dynamics and Surface Roughening Vugts MJ, Eurlings MF, Hermans LJ, Beijerinck HC Journal of Vacuum Science & Technology A, 14(5), 2780, 1996 |
5 |
Ion-Assisted Si/Xef2 Etching - Temperature-Dependence in the Range 100-1000 K Vugts MJ, Hermans LJ, Beijerinck HC Journal of Vacuum Science & Technology A, 14(5), 2820, 1996 |
6 |
Dynamics of Ion-Assisted Etching in the Si(100)/Xef2/Ar+ System on a Time-Scale 100-Mu-S-1000-S Joosten GJ, Vugts MJ, Spruijt HJ, Senhorst HA, Beijerinck HC Journal of Vacuum Science & Technology A, 12(3), 636, 1994 |
7 |
Spontaneous Etching of Si(100) by Xef2 - Test-Case for a New Beam Surface Experiment Vugts MJ, Joosten GJ, Vanoosterum A, Senhorst HA, Beijerinck HC Journal of Vacuum Science & Technology A, 12(6), 2999, 1994 |