검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Scanning capacitance microscopy imaging of silicon metal-oxide-semiconductor field effect transistors Kleiman RN, O'Malley ML, Baumann FH, Garno JP, Timp GL Journal of Vacuum Science & Technology B, 18(4), 2034, 2000 |
| 2 |
The electronic structure at the atomic scale of ultrathin gate oxides Muller DA, Sorsch T, Moccio S, Baumann FH, Evans-Lutterodt K, Timp G Nature, 399(6738), 758, 1999 |
| 3 |
Second-harmonic generation at the interface between Si(100) and thin SiO2 layers Cundiff ST, Knox WH, Baumann FH, Evans-Lutterodt KW, Green ML Journal of Vacuum Science & Technology A, 16(3), 1730, 1998 |