검색결과 : 15건
No. | Article |
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1 |
Cellular dislocations patterns in monolike silicon: Influence of stress, time under stress and impurity doping Oliveira VA, Rocha M, Lantreibecq A, Tsoutsouva MG, Tran-Thi TN, Baruchel J, Camel D Journal of Crystal Growth, 489, 42, 2018 |
2 |
Synchrotron X-ray diffraction imaging studies of dislocations in Kyropoulos grown Ti doped sapphire crystal Sen G, Caliste TNT, Stelian C, Baruchel J, Barthalay N, Duffar T Journal of Crystal Growth, 468, 477, 2017 |
3 |
Growth undercooling in multi-crystalline pure silicon and in silicon containing light impurities (C and O) Riberi-Beridot T, Tsoutsouva MG, Regula G, Reinhart G, Perichaud I, Baruchel J, Mangelinck-Noel N Journal of Crystal Growth, 466, 64, 2017 |
4 |
{111} facet growth laws and grain competition during silicon crystallization Stamelou V, Tsoutsouva MG, Riberi-Beridot T, Reinhart G, Regula G, Baruchel J, Mangelinck-Noel N Journal of Crystal Growth, 479, 1, 2017 |
5 |
On the impact of twinning on the formation of the grain structure of multi-crystalline silicon for photovoltaic applications during directional solidification Riberi-Beridot T, Mangelinck-Noel N, Tandjaoui A, Reinhart G, Billia B, Lafford T, Baruchel J, Barrallier L Journal of Crystal Growth, 418, 38, 2015 |
6 |
Segregation, precipitation and dislocation generation between seeds in directionally solidified mono-like silicon for photovoltaic applications Tsoutsouva MG, Oliveira VA, Camel D, Thi TNT, Baruchel J, Marie B, Lafford TA Journal of Crystal Growth, 401, 397, 2014 |
7 |
Investigation of grain boundary grooves at the solid-liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging Tandjaoui A, Mangelinck-Noel N, Reinhart G, Billia B, Lafford T, Baruchel J Journal of Crystal Growth, 377, 203, 2013 |
8 |
In situ analysis of the influence of convection during the initial transient of planar solidification Bogno A, Reinhart G, Buffet A, Thi HN, Billia B, Schenk T, Mangelinck-Noel N, Bergeon N, Baruchel J Journal of Crystal Growth, 318(1), 1134, 2011 |
9 |
In situ and real-time analysis of TGZM phenomena by synchrotron X-ray radiography Thi HN, Reinhart G, Buffet A, Schenk T, Mangelinck-Noel N, Jung H, Bergeon N, Billia B, Hartwig J, Baruchel J Journal of Crystal Growth, 310(11), 2906, 2008 |
10 |
In situ and real time investigation of directional solidification of Al-Ni alloys by synchrotron imaging Reinhart G, Nguyen-Thi H, Gastaldi J, Billia B, Mangelinck-Noel N, Schenk T, Hartwig J, Baruchel J Materials Science Forum, 508, 75, 2006 |