검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests Trtik P, Reeves CM, Bartos PJM Journal of Materials Science Letters, 19(10), 903, 2000 |
| No. | Article |
|---|---|
| 1 |
Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests Trtik P, Reeves CM, Bartos PJM Journal of Materials Science Letters, 19(10), 903, 2000 |