| 1 |
alpha-Diazo Ketones in On-Surface Chemistry
Liu LC, Klaasen H, Timmer A, Gao HY, Barton D, Monig H, Neugebauer J, Fuchs H, Studer A
Journal of the American Chemical Society, 140(18), 6000, 2018 |
| 2 |
Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films
Urban FK, Barton D
Thin Solid Films, 663, 116, 2018 |
| 3 |
Reactive sputter deposition and annealing of nanometer scale NiO thin films for metal-insulator-metal tunnel junction diodes
Singh A, Bhansali S, Barton D, Urban FK
Thin Solid Films, 644, 23, 2017 |
| 4 |
Comparison of three methods for ellipsometry characterization of thin absorbing films
Barton D, Urban FK
Thin Solid Films, 644, 182, 2017 |
| 5 |
Revealing colonisation and biofilm formation of an adherent coal seam associated microbial community on a coal surface
Vick SHW, Tetu SG, Sherwood N, Pinetown K, Sestak S, Vallotton P, Elbourne LDH, Greenfield P, Johnson E, Barton D, Midgley DJ, Paulsen IT
International Journal of Coal Geology, 160, 42, 2016 |
| 6 |
Technoeconomic Analysis for the Production of Mixed Alcohols via Indirect Gasification of Biomass Based on Demonstration Experiments
Dutta A, Hensley J, Bain R, Magrini K, Tan ECD, Apanel G, Barton D, Groenendijk P, Ferrari D, Jablonski W, Carpenter D
Industrial & Engineering Chemistry Research, 53(30), 12149, 2014 |
| 7 |
Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane
Urban FK, Barton D
Thin Solid Films, 562, 49, 2014 |
| 8 |
Numerical ellipsometry: Advanced analysis of thin absorbing films in the n-k plane
Urban FK, Barton D
Thin Solid Films, 519(19), 6284, 2011 |
| 9 |
Numerical ellipsometry: Analysis of thin metal layers using n-k-d twisted curve methods with multiple incidence angles
Urban FK, Barton D, Tiwald T
Journal of Vacuum Science & Technology A, 28(4), 947, 2010 |
| 10 |
Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles
Urban FK, Barton D, Tiwald T
Thin Solid Films, 518(5), 1411, 2009 |
