검색결과 : 21건
| No. | Article |
|---|---|
| 1 |
Influence of ion energy on damage induced by Au-ion implantation in silicon carbide single crystals Gentils A, Linez F, Canizares A, Simon P, Thome L, Barthe MF Journal of Materials Science, 46(19), 6390, 2011 |
| 2 |
Proceedings of the Eleventh International Workshop on Slow Positron Beam Techniques for Solids and Surfaces - Preface Barthe MF, Corbel C Applied Surface Science, 255(1), 1, 2008 |
| 3 |
Determination of defects in 6H-SiC single crystals irradiated with 20 MeV Au ions Gentils A, Barthe MF, Thome L, Behar M Applied Surface Science, 255(1), 78, 2008 |
| 4 |
Orthopositronium annihilation and emission in mesostructured thin silica and silicalite-1 films Liszkay L, Barthe MF, Corbel C, Crivelli P, Desgardin P, Etienne M, Ohdaira T, Perez P, Suzuki R, Valtchev V, Walcarius A Applied Surface Science, 255(1), 187, 2008 |
| 5 |
Nanocavity generation in SiO2 by Kr and Xe ion implantation Assaf H, Ntsoenzok E, Leoni E, Barthe MF, Ruault MO, Kaitasov O, Ashok S Electrochemical and Solid State Letters, 10(10), G72, 2007 |
| 6 |
Modifications of He implantation induced cavities in silicon by MeV silicon implantation Desgardin P, Barthe MF, Ntsoenzok E, Liu CL Applied Surface Science, 252(9), 3231, 2006 |
| 7 |
Vacancy defects induced in sintered polished UO2 disks by helium implantation Labrim H, Barthe MF, Desgardin P, Sauvage T, Blondiaux G, Corbel C, Piron JP Applied Surface Science, 252(9), 3256, 2006 |
| 8 |
Thermal evolution of vacancy defects induced in sintered UO2 disks by helium implantation Labrim H, Barthe MF, Desgardin P, Sauvage T, Blondiaux G, Corbel C, Piron JP Applied Surface Science, 252(9), 3262, 2006 |
| 9 |
Electron irradiation induced vacancy defects detected by positron annihilation in 6H-SiC Barthe MF, Henry L, Arpiainen S, Blondiaux G Materials Science Forum, 483, 473, 2005 |
| 10 |
Near surface vacancy defects in sintered polished UO2 disks Barthe MF, Guilbert S, Labrim H, Desgardin P, Sauvage T, Blondiaux G, Carlot G, Garcia P, Piron JP Materials Science Forum, 445-6, 48, 2004 |