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Interfacial chemistry and energy band alignment of TiAlO on 4H-SiC determined by X-ray photoelectron spectroscopy Wang Q, Cheng XH, Zheng L, Ye PY, Li ML, Shen LY, Li JJ, Zhang DL, Gu ZY, Yu YH Applied Surface Science, 409, 71, 2017 |
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Band alignment between PEALD-AlNO and AlGaN/GaN determined by angle-resolved X-ray photoelectron spectroscopy Wang Q, Cheng XH, Zheng L, Ye PY, Li ML, Shen LY, Li JJ, Zhang DL, Gu ZY, Yu YH Applied Surface Science, 423, 675, 2017 |
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Electronic band-offsets across Cu2O/BaZrO3 heterojunction and its stable photo-electro-chemical response: First-principles theoretical analysis and experimental optimization Sharma D, Upadhyay RK, Satpati B, Satsangi VR, Shrivastav R, Waghmare UV, Dass S Renewable Energy, 113, 503, 2017 |
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An approach for improving the carriers transport properties of a-Si:H/c-Si heterojunction solar cells with efficiency of more than 27% Wen XX, Zeng XB, Liao WG, Lei QS, Yin S Solar Energy, 96, 168, 2013 |
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Band offsets of epitaxial Tm2O3 high-k dielectric films on Si substrates by X-ray photoelectron spectroscopy Wang JJ, Fang ZB, Ji T, Ren WY, Zhu YY, He G Applied Surface Science, 258(16), 6107, 2012 |
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Effect of oxygen on tuning the TiNx metal gate work function on LaLuO3 Mitrovic IZ, Przewlocki HM, Piskorski K, Simutis G, Dhanak VR, Sedghi N, Hall S Thin Solid Films, 520(23), 6959, 2012 |
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Effect of incorporating p-type hydrogenated nanocrystalline silicon buffer layer on amorphous silicon n-i-p solar cell performances Belfar A, Ait-Kaci H Thin Solid Films, 525, 167, 2012 |
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Band alignment of metal-oxide-semiconductor structure by internal photoemission spectroscopy and spectroscopic ellipsometry Nguyen NV, Kirillov OA, Suehle JS Thin Solid Films, 519(9), 2811, 2011 |
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Experimental determination of valence band offset at PbTe/Ge(100) interface by synchrotron radiation photoelectron spectroscopy Cai CF, Wu HZ, Si JX, Zhang WH, Xu Y, Zhu JF Applied Surface Science, 256(20), 6057, 2010 |
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Semi-empirical tight binding modelling of CdSTe/CdTe, ZnSSe/ZnSe and ZnSSe/CdSe heterostructures Akinci O, Gurel HH, Unlu H Thin Solid Films, 517(7), 2431, 2009 |