검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Identification of Si/SiO2 Interface Properties in Thin-Film Transistors with Charge-Pumping Technique Balasinski A, Worley J, Huang KW, Liou FT Journal of the Electrochemical Society, 142(8), 2717, 1995 |
| No. | Article |
|---|---|
| 1 |
Identification of Si/SiO2 Interface Properties in Thin-Film Transistors with Charge-Pumping Technique Balasinski A, Worley J, Huang KW, Liou FT Journal of the Electrochemical Society, 142(8), 2717, 1995 |