검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
A comparative mismatch study of the 20 nm Gate-Last and 28 nm Gate-First bulk CMOS technologies Rahhal L, Bajolet A, Manceau JP, Rosa J, Ricq S, Lassere S, Ghibaudo G Solid-State Electronics, 108, 53, 2015 |
| 2 |
Impact of Ge proportion on advanced SiGe bulk P-MOSFET matching performances Rahhal L, Bajolet A, Cros A, Diouf C, Kergomard F, Rosa J, Bidal G, Bianchi RA, Ghibaudo G Solid-State Electronics, 85, 15, 2013 |
| 3 |
Drain-current variability in 45 nm bulk N-MOSFET with and without pocket-implants Mezzomo CM, Bajolet A, Cathignol A, Ghibaudo G Solid-State Electronics, 65-66, 163, 2011 |
| 4 |
Modeling local electrical fluctuations in 45 nm heavily pocket-implanted bulk MOSFET Mezzomo CM, Bajolet A, Cathignol A, Josse E, Ghibaudo G Solid-State Electronics, 54(11), 1359, 2010 |
| 5 |
Modeling and optimization of series resistance of planar MIM capacitors Bajolet A, Clerc R, Pananakakis G, Picollet E, Segura N, Boret S, Bruyere S, Manceau JP, Giraudin JC, Delpech P, Montes L, Ghibaudo G Solid-State Electronics, 50(7-8), 1244, 2006 |