검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Measurement of Band Offsets in Si/Si1-xGex and Si/Si1-X-Ygexcy Heterojunctions Stein BL, Yu ET, Croke ET, Hunter AT, Laursen T, Bair AE, Mayer JW, Ahn CC Journal of Vacuum Science & Technology B, 15(4), 1108, 1997 |
| 2 |
Strain-Measurements of Sigec Heteroepitaxial Layers on Si(001) Using Ion-Beam Analysis Sego S, Culbertson RJ, Smith DJ, Atzmon Z, Bair AE Journal of Vacuum Science & Technology A, 14(2), 441, 1996 |
| 3 |
Heteroepitaxial Si1-X-Ygexcy Films on (100)Si Substrates for Future Low-Power Applications Alford TL, Bair AE, Atzmon Z, Stout LM, Balster SG, Schroder DK, Roedel RJ Thin Solid Films, 270(1-2), 632, 1995 |