검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Investigation of co-sputtered LiZnSnO thin film transistors Jung HY, Park SY, Kim JI, Yang H, Choi R, Kim DH, Bae JU, Shin WS, Jeong JK Thin Solid Films, 522, 435, 2012 |
| 2 |
Reliable Bottom Gate Amorphous Indium-Gallium-Zinc Oxide Thin-Film Transistors with TiOx Passivation Layer Seo HS, Bae JU, Kim DH, Park Y, Kim CD, Kang IB, Chung IJ, Choi JH, Myoung JM Electrochemical and Solid State Letters, 12(9), H348, 2009 |
| 3 |
Investigation of copper deposition in the presence of benzotriazole Kim JJ, Kim SK, Bae JU Thin Solid Films, 415(1-2), 101, 2002 |
| 4 |
Formation of CoSi2 on various polycrystalline silicon structures and its effects on thermal stability Bae JU, Sohn DK, Park JS, Han CH, Park JW Journal of the Electrochemical Society, 147(4), 1551, 2000 |
| 5 |
Degradation of reactively sputtered Ti-Si-N films used as a barrier layer in titanium silicide/polycrystalline Si gate electrodes Park JS, Sohn DK, Lee BH, Bae JU, Byun JS, Park JW Journal of the Electrochemical Society, 146(4), 1579, 1999 |
| 6 |
Reduction of leakage current for shallow n(+)/p junction fabricated using C49TiSi(2) as a diffusion source Sohn DK, Park JS, Bae JU, Lee BH, Han CH, Park JW Journal of the Electrochemical Society, 146(10), 3837, 1999 |
| 7 |
Simultaneous formation of shallow junctions and gate doping for dual gate structures using cobalt silicide as a dopant source Park JS, Sohn DK, Bae JU, Park JW Journal of the Electrochemical Society, 146(10), 3856, 1999 |