검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Correlation of depth resolution and preferential sputtering in depth profiles of thin layers by Secondary Ion Mass Spectrometry (SIMS) Hofmann S, Lian SY, Han YS, Deng QR, Wang JY Thin Solid Films, 662, 165, 2018 |
| No. | Article |
|---|---|
| 1 |
Correlation of depth resolution and preferential sputtering in depth profiles of thin layers by Secondary Ion Mass Spectrometry (SIMS) Hofmann S, Lian SY, Han YS, Deng QR, Wang JY Thin Solid Films, 662, 165, 2018 |