검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Dislocation behavior of surface-oxygen-concentration controlled Si wafers Asazu H, Takeuchi S, Sannai H, Sudo H, Araki K, Nakamura Y, Izunome K, Sakai A Thin Solid Films, 557, 106, 2014 |
| No. | Article |
|---|---|
| 1 |
Dislocation behavior of surface-oxygen-concentration controlled Si wafers Asazu H, Takeuchi S, Sannai H, Sudo H, Araki K, Nakamura Y, Izunome K, Sakai A Thin Solid Films, 557, 106, 2014 |