검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Microstructure and strength of AlN-SiC interface studied by synchrotron X-rays Argunova TS, Gutkin MY, Shcherbachev KD, Je JH, Lim JH, Kazarova OP, Mokhov EN Journal of Materials Science, 52(8), 4244, 2017 |
| 2 |
X-ray imaging and TEM study of micropipes related to their propagation through porous SiC layer/SiC epilayer interface. Argunova TS, Gutkin MY, Je JH, Sorokin LM, Mosina GN, Savkina NS, Shuman VB, Lebedev AA Materials Science Forum, 457-460, 363, 2004 |
| 3 |
Structural transformation of dislocated micropipes in silicon carbide Gutkin MY, Sheinerman AG, Argunova TS, Mokhov EN, Je JH, Hwu Y, Tsai WL Materials Science Forum, 457-460, 367, 2004 |
| 4 |
Structural Quality of Directly Bonded Silicon-Wafers with Regularly Grooved Interfaces Kim ED, Kim SC, Park JM, Grekhov IV, Argunova TS, Kostina LS, Kudryavtzeva TV Journal of the Electrochemical Society, 144(2), 622, 1997 |