검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
(110) and (100) Sidewall-oriented FinFETs: A performance and reliability investigation Young CD, Akarvardar K, Baykan MO, Matthews K, Ok I, Ngai T, Ang KW, Pater J, Smith CE, Hussain MM, Majhi P, Hobbs C Solid-State Electronics, 78, 2, 2012 |
| 2 |
Carrier backscattering characteristics of strained silicon-on-insulator n-MOSFETs featuring silicon-carbon source/drain regions Ang KW, Chin HC, Chui KJ, Li MF, Samudra GS, Yeo YC Solid-State Electronics, 51(11-12), 1444, 2007 |
| 3 |
Integrated process of photoresist trimming and dielectric hard mask etching for sub-50 nm gate patterning Bliznetsov V, Kumar R, Lin HZ, Ang KW, Yoo WJ, Du AY Thin Solid Films, 504(1-2), 117, 2006 |