검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Determining indices of refraction for ThO2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry Evans WR, Allred DD Thin Solid Films, 515(3), 847, 2006 |
| 2 |
A rotating electrochemical cell to prepare porous silicon with different surface structures Osorio-Saucedo R, Vazquez-Lopez G, Calleja W, Allred DD, Falcony C Thin Solid Films, 338(1-2), 100, 1999 |
| 3 |
Waterjet Cutting of Cross-Linked Glass Yuan F, Johnson JA, Allred DD, Todd RH Journal of Vacuum Science & Technology A, 13(1), 136, 1995 |
| 4 |
Raman-Spectroscopic Study of the Formation of T-Mosi2 from Mo/Si Multilayers Cai M, Allred DD, Reyesmena A Journal of Vacuum Science & Technology A, 12(4), 1535, 1994 |
| 5 |
Mesostructure of Photoluminescent Porous Silicon Ruiz F, Vazquezlopez C, Gonzalezhernandez J, Allred DD, Romeroparedes G, Penasierra R, Torresdelgado G Journal of Vacuum Science & Technology A, 12(4), 2565, 1994 |
| 6 |
Emitted Current Instability from Silicon Field-Emission Emitters Due to Sputtering by Residual-Gas Ions Karain WI, Knight LV, Allred DD, Reyesmena A Journal of Vacuum Science & Technology A, 12(4), 2581, 1994 |