검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Proximity gettering of slow diffuser contaminants in CMOS image sensors Russo F, Moccia G, Nardone G, Alfonsetti R, Polsinelli G, D'Angelo A, Patacchiola A, Liverani M, Pianezza P, Lippa T, Carlini M, Polignano ML, Mica I, Cazzini E, Ceresoli M, Codegoni D Solid-State Electronics, 91, 91, 2014 |
| 2 |
X-ray reflectivity study on TiN/Ti/Si structures before and after annealing Santucci S, Giuliani P, Picozzi P, Phani AR, De Biase M, Alfonsetti R, Moccia G, Missori M Thin Solid Films, 360(1-2), 89, 2000 |
| 3 |
Studies on structural, electrical, compositional, and mechanical properties of WSix thin films produced by low-pressure chemical vapor deposition Santucci S, Lozzi L, Passacantando M, Picozzi P, Petricola P, Moccia G, Alfonsetti R, Diamanti R Journal of Vacuum Science & Technology A, 16(3), 1207, 1998 |
| 4 |
Compositional Characterization of Very Thin SiO2/Si3N4/SiO2 Stacked Films by X-Ray Photoemission Spectroscopy and Time-of-Flight Secondary-Ion Mass-Spectroscopy Techniques Santucci S, Lozzi L, Ottaviano L, Passacantando M, Picozzi P, Moccia G, Alfonsetti R, Digiacomo A, Fiorani P Journal of Vacuum Science & Technology A, 15(3), 905, 1997 |
| 5 |
Study by X-Ray Photoelectron-Spectroscopy and X-Ray-Diffraction of the Growth of Tin Thin-Films Obtained by Nitridation of Ti Layers Santucci S, Lozzi L, Passacantando M, Picozzi P, Alfonsetti R, Diamanti R, Moccia G Thin Solid Films, 290-291, 376, 1996 |