검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
On the impact of silicon nitride technology on charge trap NAND memories Sebastiani A, Scozzari C, Mauri A, Modelli A, Albini G, Piagge R, Bacciaglia P, Del Vitto A, Alessandri M, Grossi A, Tessariol P, Ghidini G Journal of Vacuum Science & Technology B, 27(1), 490, 2009 |
| 2 |
Metrology issues in thin ONO stacks measurements by spectroscopic ellipsometry and X-ray reflectivity Bellandi E, Elbaz A, Spadoni S, Piagge R, Coccorese C, Pavia G, Ferrari S, Banerjee S, Alessandri M Thin Solid Films, 450(1), 120, 2004 |
| 3 |
Nitridation of thin gate or tunnel oxides by nitric oxide Gerardi C, Zonca R, Crivelli B, Alessandri M Journal of the Electrochemical Society, 146(8), 3058, 1999 |
| 4 |
Influence of roughness and grain dimension on the optical functions of polycrystalline silicon films Borghesi A, Tallarida G, Amore G, Cazzaniga F, Queirolo G, Alessandri M, Sassella A Thin Solid Films, 313-314, 243, 1998 |
| 5 |
Electrical Characterization of Highly Reliable 8 nm Oxide Ghidini G, Alessandri M, Clementi C, Drera D, Pellizzer F Journal of the Electrochemical Society, 144(2), 758, 1997 |
| 6 |
Optical-Properties of Polycrystalline Silicon Thin-Films Deposited by Single-Wafer Chemical-Vapor-Deposition Marazzi M, Giardini ME, Borghesi A, Sassella A, Alessandri M, Ferroni G Thin Solid Films, 296(1-2), 91, 1997 |