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| No. | Article |
|---|---|
| 1 |
Effect of Al incorporation on the performance and reliability of p-type metal-oxide-semiconductor field effect transistors Heo YU, Jang TY, Kim D, Chang JS, Nguyen MC, Hasan M, Yang H, Jeong JK, Choi R, Choi C Thin Solid Films, 521, 119, 2012 |