| 1 |
Oxygen bonding configurations and defects on differently oxidized diamond surfaces studied by high resolution electron energy loss spectroscopy and X-ray photoelectron spectroscopy measurements
Li FN, Akhvlediani R, Kuntumalla MK, Hoffman A
Applied Surface Science, 465, 313, 2019 |
| 2 |
Influence of CO2 addition on hydrogen and oxygen surface bonding onto nanostructured diamond thin film surfaces deposited at low substrate temperatures
Kuntumalla MK, Fischer M, Akhvlediani R, Hoffman A
Thin Solid Films, 685, 254, 2019 |
| 3 |
Visible sub-band gap photoelectron emission from nitrogen doped and undoped polycrystalline diamond films
Elfimchev S, Chandran M, Akhvlediani R, Hoffman A
Applied Surface Science, 410, 414, 2017 |
| 4 |
Nitrogen and hydrogen content, morphology and phase composition of hot filament chemical vapor deposited diamond films from NH3/CH4/H-2 gas mixtures
Cherf S, Chandran M, Michaelson S, Elfimchev S, Akhvlediani R, Hoffman A
Thin Solid Films, 638, 264, 2017 |
| 5 |
HR-EELS study of hydrogen bonding configuration, chemical and thermal stability of detonation nanodiamond films
Michaelson S, Akhvlediani R, Petit T, Girard HA, Arnault JC, Hoffman A
Applied Surface Science, 305, 160, 2014 |
| 6 |
Amorphous carbon enhancement of hydrogen penetration into UO2
Zalkind S, Shamir N, Gouder T, Akhvlediani R, Hoffman A
Applied Surface Science, 305, 539, 2014 |
| 7 |
Hydrogen and thermal deoxidations of InSb and GaSb substrates for molecular beam epitaxial growth
Weiss E, Klin O, Grossman S, Greenberg S, Klipstein PC, Akhvlediani R, Tessler R, Edrei R, Hoffman A
Journal of Vacuum Science & Technology A, 25(4), 736, 2007 |
| 8 |
Chemical bonding and interdiffusion in scaled down SiO2/Si3N4/SiO2 stacks with top oxide formed by thermal ed copyoxidation
Saraf M, Edrei R, Akhvlediani R, Roizin Y, Shima-Edelstein R, Hoffman A
Journal of Vacuum Science & Technology B, 24(4), 1716, 2006 |
| 9 |
Ion-induced electron emission from undoped sub-micron thick diamond films
Michaelson S, Richter V, Kalish R, Hoffman A, Cheifetz E, Akhvlediani R
Thin Solid Films, 420-421, 185, 2002 |
