검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Interaction between point defects, extended defects and impurities in the Si-SiO2 system during the process of its formation Kropman D, Karner T, Abru U, Ugaste U, Mellikov E Thin Solid Films, 459(1-2), 53, 2004 |
| 2 |
Defect structure relaxation process in the Si-SiO2 system Kropman D, Abru U, Karner T Applied Surface Science, 166(1-4), 475, 2000 |
| 3 |
On the kinetics of generation of point defects in the Si-SiO2 system Kropman D, Abru U, Samoson A, Karner T Thin Solid Films, 343-344, 412, 1999 |