검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Accurate characterization of thin films on rough surfaces by spectroscopic ellipsometry Siah SC, Hoex B, Aberle G Thin Solid Films, 545, 451, 2013 |
| No. | Article |
|---|---|
| 1 |
Accurate characterization of thin films on rough surfaces by spectroscopic ellipsometry Siah SC, Hoex B, Aberle G Thin Solid Films, 545, 451, 2013 |