화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Broadband optical properties of aluminium zinc oxide thin films prepared by spatial atomic layer deposition
Fullager DB, Boreman GD, Ellinger CD, Hofmann T
Thin Solid Films, 653, 267, 2018
2 Optical characterization of epitaxial single crystal CdTe thin films on Al2O3 (0001) substrates
Jovanovic SM, Devenyi GA, Jarvis VM, Meinander K, Haapamaki CM, Kuyanov P, Gerber M, LaPierre RR, Preston JS
Thin Solid Films, 570, 155, 2014
3 Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry
Necas D, Ohlidal I, Franta D, Cudek V, Ohlidal M, Vodak J, Sladkova L, Zajickova L, Elias M, Vizd'a F
Thin Solid Films, 571, 573, 2014
4 Influence of the graphene substrate on morphology of the gold thin film. Spectroscopic ellipsometry study
Kostruba AM
Applied Surface Science, 283, 603, 2013
5 Moderately high refractive index, low optical dispersion polymers with pendant diamondoids
Robello DR
Journal of Applied Polymer Science, 127(1), 96, 2013
6 Evaluation of thin metal film thickness from light attenuation and multi-reflection effects on micro-Raman response
Camerlingo C, Lisitskiy MP, De Stefano L, Rea I, Delfino I, Lepore M
Thin Solid Films, 536, 142, 2013
7 Ellipsometric characterisation of thin films non-uniform in thickness
Necas D, Franta D, Bursikova V, Ohlidal I
Thin Solid Films, 519(9), 2715, 2011
8 Investigation of variable incidence angle spectroscopic ellipsometry for determination of below band gap uniaxial dielectric function
Kildemo M, Hunderi O
Materials Science Forum, 353-356, 417, 2001
9 Investigation of Si/SiGe heterostructure material using non-destructive optical techniques
Coonan BP, Griffin N, Beechinor JT, Murtagh M, Redmond G, Crean GM, Hollander B, Mantl S, Bozzo S, Lazzari JL, d'Avitaya FA, Derrien J, Paul DJ
Thin Solid Films, 364(1-2), 75, 2000
10 Multiple minima in the ellipsometric error function
Alterovitz SA, Johs B
Thin Solid Films, 313-314, 124, 1998