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Surface morphology evolution of CeO2/YSZ (001) buffer layers fabricated via magnetron sputtering Zhang YY, Feng F, Shi K, Lu HP, Xiao SZ, Wu W, Huang RX, Qu TM, Wang XH, Wang Z, Han ZH Applied Surface Science, 284, 150, 2013 |
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Semicrystalline polyphosphazenes: A comparative study of topology, morphology, and contact angles for three fluorous and one aryl polyphosphazene King A, Presnall D, Steely LB, Allcock HR, Wynne KJ Polymer, 54(3), 1123, 2013 |
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Rapid preparation of highly ordered ultraflat ZnO surfaces Gotzen J, Witte G Applied Surface Science, 258(24), 10144, 2012 |
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Visualization of thermally-activated degradation pathways of tris(8-hydroxyquinoline) aluminum thin films for electroluminescence application Xu MS, Xu JB Thin Solid Films, 491(1-2), 317, 2005 |
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Evolution of surface morphology of Si-trench sidewalls during hydrogen annealing Hiruta R, Kuribayashi H, Shimizu S, Sudoh K, Iwasaki H Applied Surface Science, 237(1-4), 63, 2004 |
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Optical anisotropy and surface morphology of InGaAs lattice-mismatched with GaAS(001) Morimura T, Mori T, Cho MW, Hanada T, Yao T Current Applied Physics, 4(6), 621, 2004 |
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Effects on surface morphology of epitaxial Y2O3 layers on Si(001) after postgrowth annealing Ioannou-Sougleridis V, Constantoudis V, Alexe M, Scholz R, Vellianitis G, Dimoulas A Thin Solid Films, 468(1-2), 303, 2004 |
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Formation of nano-sized pinholes array in thin Ni film on MgO(100) substrate Lin C, Naramoto H, Xu YH, Kitazawa S, Narumi K, Sakai S Thin Solid Films, 443(1-2), 28, 2003 |
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The post-annealing temperature dependences of electrical properties and surface morphologies for arsenic ion-implanted 4H-SiC at high temperature Senzaki J, Fukuda K, Imai S, Tanaka Y, Kobayashi N, Tanoue H, Okushi H, Arai K Applied Surface Science, 159, 544, 2000 |
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Surface characterization of NdF3 layers on Si(111) substrates grown by molecular beam epitaxy Ko JM, Inaba K, Durbin SD, Fukuda T Journal of Crystal Growth, 212(1-2), 155, 2000 |