| 1 |
Quantitative evaluation of sputtering induced surface roughness and its influence on AES depth profiles of polycrystalline Ni/Cu multilayer thin films
Yan XL, Coetsee E, Wang JY, Swart HC, Terblans JJ
Applied Surface Science, 411, 73, 2017 |
| 2 |
Investigation of interdiffusion and depth resolution in Cu/Ni multilayers by means of AES depth profiling
Yan XL, Liu Y, Swart HC, Wang JY, Terblans JJ
Applied Surface Science, 364, 567, 2016 |
| 3 |
Determination of the thickness distribution of a graphene layer grown on a 2'' SiC wafer by means of Auger electron spectroscopy depth profiling
Gurban S, Pecz B, Menyhard M, Yakimova R
Applied Surface Science, 316, 301, 2014 |
| 4 |
Auger electron spectroscopy of Au/NiOx contacts on p-GaN annealed in N-2 and O-2+N-2 ambients
Liday J, Hotovy I, Sitter H, Schmidegg K, Vogrincic P, Bonnani A, Breza J, Ecke G, Vavra I
Applied Surface Science, 253(6), 3174, 2007 |
| 5 |
Auger electron spectroscopy depth profiling of Fe-oxide layers on electromagnetic sheets prepared by low temperature oxidation
Kovac J, Bizjak M, Pracek B, Zalar A
Applied Surface Science, 253(9), 4132, 2007 |
| 6 |
Ion bombardment induced interface broadening in Co/Cu system as a function of layer thickness
Barna A, Menyhard A, Zalar A, Panjan P
Applied Surface Science, 242(3-4), 375, 2005 |
| 7 |
AES depth profiling and interface analysis of C/Ta bilayers
Zalar A, Kovac J, Pracek B, Hofmann S, Panjan P
Applied Surface Science, 252(5), 2056, 2005 |
| 8 |
Depth dependences of the ion bombardment induced roughness and of the interdiffusion coefficient for Si/Al multilayers
Wang JY, Zalar A, Mittemeijer EJ
Applied Surface Science, 222(1-4), 171, 2004 |
| 9 |
Quantification of AES depth profiles by the MRI model
Kovac J, Zalar A, Pracek B
Applied Surface Science, 207(1-4), 128, 2003 |
| 10 |
Determination of the interdiffusion coefficient for Si/Al multilayers by Auger electron spectroscopical sputter depth profiling
Wang JY, Zalar A, Zhao YH, Mittemeijer EJ
Thin Solid Films, 433(1-2), 92, 2003 |
