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| No. | Article |
|---|---|
| 1 |
Suppression of gate-induced drain leakage by optimization of junction profiles in 22 nm and 32 nm SOI nFETs Schenk A Solid-State Electronics, 54(2), 115, 2010 |
| No. | Article |
|---|---|
| 1 |
Suppression of gate-induced drain leakage by optimization of junction profiles in 22 nm and 32 nm SOI nFETs Schenk A Solid-State Electronics, 54(2), 115, 2010 |