화학공학소재연구정보센터
검색결과 : 16건
No. Article
1 Interaction of 157 nm excimer laser on pristine and radiation exposed CR39 polymer
Zakaria R, Scott RM
Applied Surface Science, 274, 53, 2013
2 Interaction of 157-nm excimer laser radiation with fluorocarbon polymers
George SR, Leraas JA, Langford SC, Dickinson JT
Applied Surface Science, 255(24), 9558, 2009
3 Light induced adsorption of Si nano-composites in LiF crystals at 157 nm
Sarantopoulou E, Kollia Z, Cefalas AC, Kobe S
Applied Surface Science, 253(9), 4438, 2007
4 Polymer self-assembled nano-structures and surface relief gratings induced with laser at 157 nm
Sarantopoulou E, Kollia Z, Cefalas AC, Douvas AM, Chatzichristidi M, Argitis P, Kobe S
Applied Surface Science, 253(19), 7884, 2007
5 Growth of crystalline/amorphous biphase Sm-Fe-Ta-N magnetic nanodroplets
Kobe S, Sarantopoulou E, Drazic G, Kovac J, Janeva M, Kollia Z, Cefalas AC
Applied Surface Science, 254(4), 1027, 2007
6 Preparation of ultra-thin films of DNA bases with laser light at 157 mm
Sarantopoulou E, Kollia Z, Cefalas AC, Samardzija Z, Kobe S
Thin Solid Films, 495(1-2), 45, 2006
7 Current trends in 157 nm dry lithography
Cefalas AC
Applied Surface Science, 247(1-4), 577, 2005
8 Self assembled structures on fluoro-polymers induced with laser light at 157 nm
Kollia Z, Sarantopoulou E, Cefalas AC, Kobe S, Argitis P, Missiakos K
Applied Surface Science, 248(1-4), 248, 2005
9 Nanocrystalline Sm-Fe composites fabricated by pulse laser deposition at 157 nm
Kobe S, Zuzek K, Sarantopoulou E, Samardzija Z, Kollia Z, Cefalas AC
Applied Surface Science, 248(1-4), 349, 2005
10 Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronics
Boher P, Evrard P, Condat O, Dos Reis C, Defranoux C, Piel JP, Stehle JL, Bellandi E
Thin Solid Films, 455-56, 798, 2004