| 학회 | 한국공업화학회 |
| 학술대회 | 2010년 봄 (05/13 ~ 05/14, BEXCO(부산)) |
| 권호 | 14권 1호 |
| 발표분야 | 전기화학 |
| 제목 | Characterization of YSZ irradiated with H or Xe ions |
| 초록 | In the present study, we investigated the influence of the radiation on the physical and structural properties of YSZ. YSZ had been irradiated at room temperature with H or Xe ions. The ion energy was 120 keV or 5 MeV and the fluence was in therange of 1*1015 ~ 1*1017 ions/cm2. TEM and XRD methods are utilized to measure the changes of the physical and structural properties of YSZ. The annealing effects were also studied. |
| 저자 | 김태형, 류부형, 이인자 |
| 소속 | 동국대 |
| 키워드 | SOFC; YSZ; ion beam |
