| 학회 | 한국재료학회 |
| 학술대회 | 2014년 봄 (05/15 ~ 05/16, 창원컨벤션센터) |
| 권호 | 20권 1호 |
| 발표분야 | E. 구조 재료(Structural Materials) |
| 제목 | Measured Residual Stress Tensor Distribution around Heterogeneous Interfaces |
| 초록 | Experimental efforts have been made in author’s laboratory to measure the actual stress/strain in a micro-area around heterogeneous interfaces since 1985. The measurement methods being developed and applied are X-ray micro-sin2Ψ method, micro-area X-ray 2D method, surface acoustic wave, micro-Raman scattering, micro-FTIR and convergent beam electron diffraction (CBED) in TEM. These methods provide tools to evaluate the actual stress/strain quantitatively in a micro-area for all material. The diameter of measured area ranged from sub-millimeters to nanometers. In this presentation I will show examples of measured residual stress tensor distributions around brazed interfaces of Si3N4/Cu/low carbon steel and Si3N4/Cu/stainless steel using micro-area X-ray 2D method. This method provides three dimensional tensor of normal stresses, σii, and shear stresses, σij, where i, j =1, 2 & 3 denote specimen coordinates, and principal stresses σI-III. X-ray conditions for Si3N4 were Cr-Kα 38 kV, 16 mA at (212) 2θ0=131.55 deg and irradiated area in Si3N4 was 0.1 and 0.2 mm in diameter with collimator. Around a singularity point of the interface, normal stress values perpendicular to the interface reached only 60 MPa in tensile, on the other hand maximum principal stress exceeded 180 MPa by the influence of shear stress. Stress values in depth direction reached within 30 MPa. Residual stress tensor distributions around other interfaces will be also presented in detail. |
| 저자 | Shun-Ichiro Tanaka |
| 소속 | Institute of Multidisciplinary Research for Advanced Materials |
| 키워드 | Residual stress; Micro-area X-ray 2D method; Heterogeneous interfaces |
