| 초록 |
Basics of synchrotron radiation and, among the various synchrotron techniques, grazing incidence X-ray scattering (GIXS) is introduced in this talk. GIXS technique is appropriate to the characterization of orgnic thin films ranging from Å to a few hundreds nm, in which structure information of both in- and out-of-plane are supplied. Rescently, organic thin films have received considerable attention for various applications: flexible flat panel displays, electronic paper, organic light emitting diodes, smart cards, smart inventory tags, intelligent sensor arrays, organic photovoltaic cells, and etc. It has been widely known that the electrical properties of organic based devices strongly depend on the crystal structure and molecular orientation of the organic layer. Therefore, profound structural and morphological studies of organic films from ultra-thin to multilayers can provide insight to the origin of the ‘structure-property’ relationship, which makes it possible to design high-performance devices. |
